spec-, spic-, spect-, spectat-, spectro- -spectr, -spectful, -spection, -spective

A spectroscope (instrument for dispersing light) equipped to photograph or otherwise record spectra (a continuous distribution of colored lights).

1. An image of the sun produced using a narrow wavelength band of the radiation it emits.
2. A photograph of the sun made with a spectroheliograph taken in a narrow wavelength band centered on a selected wavelength.

1. An instrument for taking photographs (spectroheliograms) of an image of the sun in monochromatic light or over a narrow band of wavelengths.
2. An apparatus for making photographs of the sun with a monochromatic light to show the details of the sun's surface and surroundings as they would appear if the sun emitted only that light.

1. An irrational dread of specters, or of phantoms.
2. A fear of looking in a mirror at one's own image or seeing the images of others.
3. The hysterical terror for mirrors and the dread of catching sight of one's own face in a mirror or seeing the images of others.

1. A device in which a body of gas may be caused to emit sound waves when illuminated by a periodically interrupted beam of electromagnetic radiation (usually, visible or infra-red).
2. An instrument constructed on the principle of the photophone and used in spectrum analysis as an adjunct to the spectroscope.
3. Spectrophone measurements of the absorption of visible light by aerosols in the atmosphere.

A device that gathers information on the polarization state of individual chemical reactions from a star seen as lines in the star's spectrum.

1. An instrument for determining the radiant-energy distribution in a spectrum, combining the functions of a spectroscope with those of a radiometer.
2. A digital light meter that measures spectral wavelength color and reflectance of UV to the infrared, lux color, etc.

An instrument that disperses light into its spectrum, magnifies it, and displays it for observation.

A reference to or using a spectroscope.

1. A spectroscopic ellipsometer allows for the accurate characterization of a range of properties including the layer thickness, optical constants, composition, crystallinity anisotropy, and uniformity.
2. Ellipsometry which uses more than one wavelength and allows variation of an angle of incidence; measures not only film thickness, but also provides information on select chemical/physical characteristics of the film(s); very useful in process monitoring and diagnostic.
3. Ellipsometry which uses more than one wavelength and allows variation of an angle of incidence; measures not only film thickness, but also provides information on select chemical/physical characteristics of the film(s); very useful in process monitoring and diagnostic.

Ellipsometry is the most common way of measuring thickness of thin films; based on the detection of phase shift of plane polarized incident light beam during reflection from the surface.

Thickness determines ranging from a few angstroms to tens of microns are possible for single layers and complex multilayer stacks.